V0001 · Fixed price
Test bundel
Grade distribution
Battery, measuredNot measureduntested lot
Lock status0 lockedall 0 free of BIOS and MDM locks
Most common defectsAs-isnot tested; wiped only
Photos of the actual lot: pallet, a sample of units and close-ups of defects for grades B and C.
The journey of this lot
- First lifeBusiness use
- CollectedBy Relay IT, with a collection note
- WipedNIST 800-88, certificate per serial number
- TestedPassed on untested, as received
- Next lifeReady for the next user
1 devices carry on instead of new ones: roughly 0.2–0.3 tonnes less CO₂. Methodology
Manifest. 1 lines, every column filled in.
Per serial number: grade, battery, charge cycles, memory, defects and lock status. Every lot in the same format.
| # | Serial number | Model | Grade | Battery | Cycles | Memory | Defects | Lock |
|---|---|---|---|---|---|---|---|---|
| No units match these filters. | ||||||||
0 of 0 shown
Defects: Scratches on the casing · Screen damage · Keyboard · Battery below 60% · Hinge or casing. How we grade
| Lot number | V0001 |
|---|---|
| Quantity | 1 units |
| Processor | |
| Memory | |
| Storage | |
| Screen | |
| Keyboard | |
| Operating system | |
| Chargers | Not included |
| Origin |